Analysis of white-light interferograms by using Stockwell transform
Zehra Sarac
article (Uluslararası, Hakemli) | Yazar(lar): Zehra Sarac | Yıl: 2008 | Dergi/Kurum: OPTICS AND LASERS IN ENGINEERING | İndeks: WOS.SCI | DOI: 10.1016/j.optlaseng.2008.05.017 | Anahtar Kelimeler: Stockwell transform, white-light interferogram, standard deviation, sampling, intensity and dispersion noise — Özet: This pa
This paper proposes the use of Stockwell transform for the analysis of white-light interferograms. The performance of Stockwell transform is assessed from the statistical parameters obtained by analyzing the simulated and experimental interferograms. Furthermore, the sensitivity of Stockwell transform to intensity and the phase noises is investigated. Results show that sampling and intensity noises significantly affect the performance of Stockwell transform. (C) 2008 Elsevier Ltd. All rights reserved.